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Remote Sensing and GIS for Site Characterization

Vernon Singhroy, Douglas Daniel Nebert, and Arnold Ivan Johnson

Contains selected papers from the title international symposium, held in January 1994 in San Francisco, CA. Sections on remote sensing applications, geographic information system (GIS), site characterization, and standards detail the latest ...

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Remote Sensing and Gis for Site Characterization: Applications and Standards (Astm Special Technical Publication)

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Length: 175 pages

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