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Hot-Carrier Effects in MOS Devices

Eiji Takeda, Cary Y. Yang, Cary Y.-W. Yang, and Akemi Miura-Hamada

... Capacitors : The Effect of Gate - Induced Strain , " Appl . Phys . Lett . 48 ... MOSFET and LATID ( Large - Tilt Angle Implanted ... Taur , and T. H. Ning , “ A Comparative Study of Hot - Carrier Instabilities in p- and n - type Poly Gate MOS ...

Poly Gate MOS ...

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Hot-Carrier Effects in MOS Devices

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Length: 329 pages

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